APPLICATION OF ELECTRICAL CAPACITANCE TOMOGRAPHY FOR DENSE CROSS-SECTIONAL PARTICLE MIGRATION IN A MICROCHANNEL. Jurnal Teknologi, [S. l.], v. 77, n. 17, 2015. DOI: 10.11113/jt.v77.6459. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/6459.. Acesso em: 7 jul. 2024.