MECHANISM OF BIJUNCTION SEMICONDUCTOR DEVICE DAMAGE INDUCED BY HEAVY PARTICLES. Jurnal Teknologi, [S. l.], v. 78, n. 2-2, 2015. DOI: 10.11113/jt.v78.6938. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/6938.. Acesso em: 23 jul. 2024.