Resolution and Noise Properties of CMOS and CR Digital Radiography Systems. Jurnal Teknologi, [S. l.], v. 52, n. 1, p. 103–115, 2012. DOI: 10.11113/jt.v52.126. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/126.. Acesso em: 23 jul. 2024.