Modeling And Characterization Of Majority (MAJ) Type Single–Electron Full Adder Using Simon. Jurnal Teknologi, [S. l.], v. 49, n. 1, p. 107–116, 2012. DOI: 10.11113/jt.v49.200. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/200.. Acesso em: 23 jul. 2024.