1.
STRESS LEVEL AND COGNITIVE LOAD TEST OF HIGH SCHOOL STUDENTS BASED ON THE ANALYSIS OF CONSUMER-GRADE EEG SIGNAL AND NASA-TLX QUESTIONNAIRE. J. Teknol. [Internet]. 2026 Apr. 30 [cited 2026 Sep. 13];88(3):539-4. Available from: https://journals.utm.my/jurnalteknologi/article/view/24938