GRID INDEPENDENT STUDY ON TETRAHEDRAL AND HEXAHEDRAL DOMINANT ELEMENTS TYPES IN FINITE ELEMENT ANALYSIS OF INTEGRATED CIRCUIT PACKAGE

Authors

  • Khairul Fadzli Samat Faculty of Manufacturing Engineering, Universiti Teknikal, Malaysia Melaka (UTeM), Melaka, Malaysia
  • Rosidah Jaafar Faculty of Manufacturing Engineering, Universiti Teknikal, Malaysia Melaka (UTeM), Melaka, Malaysia
  • Muhammad Idzdihar Idris Faculty of Manufacturing Engineering, Universiti Teknikal, Malaysia Melaka (UTeM), Melaka, Malaysia
  • Vincent Ong, Maidin, S. Faculty of Electronic and Computer Engineering, Universiti Teknikal, Malaysia Melaka (UTeM), Melaka, Malaysia
  • Mohd Shahir Kasim Faculty of Manufacturing Engineering, Universiti Teknikal, Malaysia Melaka (UTeM), Melaka, Malaysia
  • Zulkeflee Abdullah Faculty of Manufacturing Engineering, Universiti Teknikal, Malaysia Melaka (UTeM), Melaka, Malaysia

DOI:

https://doi.org/10.11113/jt.v79.11282

Keywords:

Finite element analysis, quasi-static, IC package strength, tetrahedral elements, hexahedral elements

Abstract

The development of integrated circuit (IC) packaging is one of the important factors for the advanced production of the semi-conductor industry. With the recent rise of innovative demand of the production technology, lot of issues had been raised at the manufacturing level especially at back-end production. In order to solve the problem, finite element analysis (FEA) is one of the methods that has been broadly used to evaluate the internal stress of IC package. The performance effect of tetrahedral or hexahedral dominance elements in the meshing stage may lead to the unswerving of FEA results. In such condition, the performance of the element type needs to be analyzed in order to determine which implementation leads to result with higher confident level. This study used the quasi-static simulation of FEA to determine the performance of tetrahedral and hexahedral dominance elements in FEA of IC package strength. The monitored stress was focused on the component levels of IC package, the die and the diepad. The IC package is modelled in three-dimensional case which represented as close as the actual product by simplifying certain parts. The performance evaluation had considered the effect of grid independent study for each of the element type. The maximum stress produced by using the tetrahedral element had been compared with the stress produced by the hexahedral dominance elements. Comparison of the performance showed that the value of the maximum stress produced from hexahedral dominance element was significantly higher at 16% to 40% than the solution obtained from the tetrahedral element. It is found that by using hexahedral element in the finite element analysis, a significant higher value of Von Mises stress is produced, which is more than 505 MPa in diepad. This stress value has been established by previous study within the plastic deformation range and also has good agreement with the physical examination. 

References

Lofrano, M., Gonzalez, M., Guo, W. and Van Der Plas, G. 2015. Chip Package Interaction: A Stress Analysis on 3D IC's Packages. Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). 16th International Conference on IEEE. April 2015. 1-9.

Che, F. X., Lin, J. K., Au, K. Y., Hsiao, H. Y., & Zhang, X. 2015. Stress Analysis and Design Optimization for Low-Chip with Cu Pillar Interconnection. IEEE Transactions on Components, Packaging and Manufacturing Technology. 5(9): 1273-1283.

Mazzei, S., Madia, M., Beretta, S., Mancaleoni, A. and Aparo, S. 2014. Analysis of Cu-Wire Pull and Shear Test Failure Modes under Ageing Cycles and Finite Element Modelling of Si-Crack Propagation. Microelectronics Reliability. 54(11): 2501-2512.

Belhenini, S., Tougui, A., Bouchou, A. and Dosseul, F. 2014. 3D Finite Element Modeling of 3D C2W (Chip To Wafer) Drop Test Reliability. Optimization of Internal Architecture and Materials. Microelectronics Reliability. 54(1): 13-21.

Salahouelhadj, A., Gonzalez, M. and Oprins, H. 2015. Die Thickness Impact on Thermo-Mechanical Stress in 3D Packages. Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). 16th International Conference on IEEE. April 2015. 1-6.

Stolk, J., Verdonschot, N. and Huiskes, R. 2001. Management of Stress Fields Around Singular Points in a Finite Element Analysis. Computer Methods in Biomechanics and Biomedical Engineering. Gordon and Breach Science Publishers. 57.

Verma, A. and Melosh, R.J. 1987. Numerical Tests for Assessing Finite Element Model Grid Independent. International Journal for Numerical Methods in Engineering. 24(5): 843-857.

Benzley, S.E., Perry, E., Merkley, K., Clark, B. and Sjaardama, G. 1995. A Comparison of All Hexagonal and All Tetrahedral Finite Element Meshes for Elastic and Elasto-Plastic Analysis. 4th International Meshing Roundtable. October 1995. 179-191.

Brown, J. 1997. Characterization of MSC/NASTRAN & MSC/ABAQUS Elements for Turbine Engine Blade Frequency Analysis. Proc. MSC Aerospace Users' Conference.

Tadepalli, S. C., Erdemir, A. and Cavanagh, P. R. 2011. Comparison of Hexahedral and Tetrahedral Elements in Finite Element Analysis of the Foot and Footwear. Journal of Biomechanics. 44(12): 2337-2343.

A. J. Oster. 2014. Alloy Data: C19400 ASTM B465. Retrieved from http://www.ajoster.com. 22 ‎September ‎2014.

Ablestik. 2005. Technical Datasheet: Ablebond 3230.

YuQi, J., Liang, S., Wang, M. and Xianzhong, S. 2005. FEA Simulation on the MCP Bottom Die Cracking Issue. Physical and Failure Analysis of Integrated Circuits. Proceedings of the 12th International Symposium on the IEEE. 2015. 313-317.

Yu, F., Sang, W., Pang, E., Liu, D. and Teng, J. 2002. Stress Analysis in Silicon Die Under Different Types of Mechanical Loading by Finite Element Method (FEM). IEEE transactions on Advanced Packaging. 25(4): 522-527.

Heng, L.T., Fei, C.C. and Subaramaniym, S. 2008. 40μm Die Strength Characterization. Electronics Packaging Technology Conference, EPTC 10th, IEEE. December 2008. 328-337.

Tsai, M.Y. and Chen, C.H. 2008. Evaluation of Test Methods for Silicon Die Strength. Microelectronics Reliability. 48(6): 933-941.

Ramos, A. and Simoes, J.A. 2006. Tetrahedral Versus Hexahedral Finite Elements in Numerical Modelling of The Proximal Femur. Medical Engineering & Physics. 28(9): 916-924.

Downloads

Published

2017-07-19

How to Cite

GRID INDEPENDENT STUDY ON TETRAHEDRAL AND HEXAHEDRAL DOMINANT ELEMENTS TYPES IN FINITE ELEMENT ANALYSIS OF INTEGRATED CIRCUIT PACKAGE. (2017). Jurnal Teknologi, 79(5-2). https://doi.org/10.11113/jt.v79.11282