Determination of Ion Beam Properties In Nitrogen and Helium Using Mather Type Plasma Focus Device

Authors

  • Someraa Saleh Shakonah Institute of Advanced Photonic Science, Nanotechnology Research Alliance, Department of Physics, Faculty of Science, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor Malaysia
  • Jalil Ali Institute of Advanced Photonic Science, Nanotechnology Research Alliance, Department of Physics, Faculty of Science, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor Malaysia
  • Natashah Abd. Rashid Institute of Advanced Photonic Science, Nanotechnology Research Alliance, Department of Physics, Faculty of Science, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor Malaysia
  • Kashif Chaudhary Institute of Advanced Photonic Science, Nanotechnology Research Alliance, Department of Physics, Faculty of Science, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor Malaysia

DOI:

https://doi.org/10.11113/jt.v71.3852

Keywords:

Ion beam flux and fluence, Lee model, Nitrogen and Helium gases, Plasma focus

Abstract

Some of ion beam properties have been investigated by using Lee model code on plasma focus devices which is operated with nitrogen and helium gases. The operation of plasma focus in different pressure regime gives a consistent ion beam properties which can make the plasma focus a reliable ion beam source .These ion beam properties such as ion beam flux, ion beam fluence, ion beam energy, ion beam current, and beam ion number corresponding to gas pressure have been studied for Mather type plasma focus device. The result shows the differences between helium as lighter gas and nitrogen as heavier gas in term of ion beam properties. The fluence and flux are decrease for nitrogen while increase for helium. 

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Published

2014-12-30

Issue

Vol. 71 No. 5: ​Special Issue on Fifth International Graduate Conference on Engineering, Science & Humanities

Section

Science and Engineering

License

Copyright of articles that appear in Jurnal Teknologi belongs exclusively to Penerbit Universiti Teknologi Malaysia (Penerbit UTM Press). This copyright covers the rights to reproduce the article, including reprints, electronic reproductions, or any other reproductions of similar nature.

How to Cite

Determination of Ion Beam Properties In Nitrogen and Helium Using Mather Type Plasma Focus Device. (2014). Jurnal Teknologi, 71(5). https://doi.org/10.11113/jt.v71.3852