An Accurate Operation of Wideband Multi-Port Reflectometer with New Calibration Method implementing Least Mean Square for Microwave Imaging Application
DOI:
https://doi.org/10.11113/jt.v73.4256Keywords:
Calibration, Least Mean Square (LMS), multi-port reflectometer, overlapped phase characteristics, widebandAbstract
The wideband operation of multi-port reflectometer may lead to inaccurate reflection coefficient measurement caused by the overlapped phase characteristics of the used calibration standards. Therefore, a calibration procedure implementing Least Mean Square (LMS) is proposed to offer accurate operation of wideband multi-port reflectometer from 1 to 6 GHz. Its well wideband performance is verified by attenuators of 3, 6 and 10 dB that assessed as the device under tests (DUTs). The proposed LMS contains a learning rate, m and updated weight coefficient, W(k+1) to eliminate error and achieve the corrected reflection coefficient of DUT.
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