THE ANALYSIS OF TWO-PROFILE ENVIRONMENT GROUND CLUTTER STATISTICS MEASURED USING FORWARD SCATTER RADAR WITH VHF AND UHF BANDS

Authors

  • N. N. Ismail Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM) 40450 Shah Alam, Selangor, Malaysia
  • N. E. A. Rashid Applied Electromagnetic Research Group (AERG), Advanced Computing and Communication Communities of Research, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia
  • Z. Ismail Khan Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM) 40450 Shah Alam, Selangor, Malaysia
  • N. Ripin Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM) 40450 Shah Alam, Selangor, Malaysia
  • M. F. Abdul Rashid Forest Engineering Unit, Geoinformation Program, Forestry & Enviromental Division, Forest Research Institute Malaysia (FRIM), 52109 Kepong, Selangor, Malaysia

DOI:

https://doi.org/10.11113/jt.v78.6215

Keywords:

FSR, VHF, UHF, Weibull, Gamma, Log-Logistic, Log-Normal, GOF, RMSE, CS

Abstract

In this paper, a FSR two-profile environment ground clutter-measured signal with very high frequency (VHF) and ultra high frequency (UFH) at a border of dense forest and free space area are presented. Statistical distribution method is used to model the clutter signal, namely Weibull, Gamma, Log-Logistic and Log-Normal distribution. Two goodness-of-fit (GOF) tests are used to calculate the error between the amplitude of the clutter data and the statistical model, which are the root mean square error (RMSE) and chi-square (CS). At the end of this analysis, Weibull model was found to be the best fit for 64 MHz clutter signal while Gamma model is best fitted at 151 MHz carrier frequency. Another model known as Log-Logistic model fits well to a clutter signal measured with 434 MHz carrier frequency.

References

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Published

2016-06-22

Issue

Section

Science and Engineering

How to Cite

THE ANALYSIS OF TWO-PROFILE ENVIRONMENT GROUND CLUTTER STATISTICS MEASURED USING FORWARD SCATTER RADAR WITH VHF AND UHF BANDS. (2016). Jurnal Teknologi (Sciences & Engineering), 78(7). https://doi.org/10.11113/jt.v78.6215