STABILITY TEST FOR NaI(TI) SCINTILLATION DETECTOR

Authors

  • Yvette Susiapan Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Ruzairi Abd. Rahim Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Rasif Mohd. Zain Malaysian Nuclear Agency, Bangi, Malaysia
  • Ahmad Ridwan Wahab Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Herman Wahid Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Mohd Hafis Izran Ishak Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Salinda Bunyamin Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Yusri Yunus Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia
  • Leow Pei Ling Process Tomography and Instrumentation Engineering Research Group (PROTOM-i), Innovative Engineering Research Alliance, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Johor Bahru, Johor, Malaysia

DOI:

https://doi.org/10.11113/jt.v77.6419

Keywords:

Stability test, scintillation detector, gamma-ray tomography, gamma-ray transmission

Abstract

The objective of this endeavor is to present a brief description of a stability test performed on a NaI(TI) scintillation detector to determine its most suitable operating voltage range. The Chi-square test is used to check the reliability of the data obtained. Some test results are included.

References

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Published

2015-11-24

Issue

Vol. 77 No. 17: Special Issue on Sensor Technology and Control System Applications Vol. 3

Section

Science and Engineering

License

Copyright of articles that appear in Jurnal Teknologi belongs exclusively to Penerbit Universiti Teknologi Malaysia (Penerbit UTM Press). This copyright covers the rights to reproduce the article, including reprints, electronic reproductions, or any other reproductions of similar nature.

How to Cite

STABILITY TEST FOR NaI(TI) SCINTILLATION DETECTOR. (2015). Jurnal Teknologi, 77(17). https://doi.org/10.11113/jt.v77.6419