A Cost Of Test Case Study For Wafer-Ring Multi-Sites Test Handler In Semiconductor’s Industry Through Theory Of The Firm. Jurnal Teknologi, [S. l.], v. 73, n. 1, 2015. DOI: 10.11113/jt.v73.2855. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/2855.. Acesso em: 23 jul. 2024.