NUMERICAL STUDIES OF ION BEAM IN NX2 PLASMA FOCUS FOR DIFFERENT APPLIED VOLTAGE. Jurnal Teknologi (Sciences & Engineering), [S. l.], v. 78, n. 3-2, 2016. DOI: 10.11113/jt.v78.7828. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/7828.. Acesso em: 19 dec. 2024.