Determination of Ion Beam Properties In Nitrogen and Helium Using Mather Type Plasma Focus Device. Jurnal Teknologi, [S. l.], v. 71, n. 5, 2014. DOI: 10.11113/jt.v71.3852. Disponível em: https://journals.utm.my/jurnalteknologi/article/view/3852.. Acesso em: 17 may. 2024.